Geodesic
Asymptotically optimal in reliability circuits in two bases under failures of 0 (k−1) type at the outputs of elements
Izvestiâ vysših učebnyh zavedenij. Matematika, no. 5 (2018), pp. 3-12.

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We consider the problem of the realization of k-meaning logics (k≥3) circuits in the two bases: in Rosser–Turkett basis and in its dual basis. We assume that the basic elements are exposed to faults on the outputs: only type 0 or only type k−1, and they go into fault conditions independently. We describe a constructive method for the synthesis of asymptotically optimal reliable circuit for almost any k-meaning logic function, we found the upper and lower bounds of circuits unreliability and the class of functions for which the lower bound is true.
Mots-clés : k-meaning logics function, unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates, fault of type 0, fault of type k−1. 
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M. A. Alekhina; O. Yu. Barsukova. Asymptotically optimal in reliability circuits in two bases under failures of $0$ ($k-1$) type at the outputs of elements. Izvestiâ vysših učebnyh zavedenij. Matematika, no. 5 (2018), pp. 3-12. https://geodesic-test.mathdoc.fr/item/IVM_2018_5_a0/

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